Resistance of Radiation Tolerant TMR Shift Registers to Optical Fault Injections

Authors

  • Dmytro Petryk IHP – Leibniz-Institut für innovative Mikroelektronik
  • Peter Langendörfer IHP – Leibniz-Institut für innovative Mikroelektronik, BTU Cottbus-Senftenberg
  • Zoya Dika IHP – Leibniz-Institut für innovative Mikroelektronik, BTU Cottbus-Senftenberg

Keywords:

Fault Injection attack, laser, reliability, security, triple modular redundancy, standard library, rad-hard flip-flops

Abstract

Protection of information is essential for IoT devices. They are often subject to lab analysis with the objective to reveal secret hidden information. One of the ways to reveal the cryptographic key is to perform optical Fault Injection attacks. In this work, we investigated the IHP radiation tolerant shift registers built of Triple Modular Redundant flip-flops. In our experiments, we were able to inject different transient faults into TMR registers using a single laser beam.

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Published

2024-08-20

How to Cite

Petryk, D., Langendörfer, P., & Dika, Z. (2024). Resistance of Radiation Tolerant TMR Shift Registers to Optical Fault Injections. WiPiEC Journal - Works in Progress in Embedded Computing Journal, 10(2). Retrieved from https://wipiec.digitalheritage.me/index.php/wipiecjournal/article/view/56